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M13S2561616A-2S Datasheet(PDF) 6 Page - Elite Semiconductor Memory Technology Inc. |
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M13S2561616A-2S Datasheet(HTML) 6 Page - Elite Semiconductor Memory Technology Inc. |
6 / 49 page ESMT M13S2561616A (2S) Operation Temperature Condition -40°C~85°C Elite Semiconductor Memory Technology Inc. Publication Date : Jan. 2015 Revision : 1.0 6/49 IDD Parameters and Test Conditions Test Condition Symbol Note Operating Current (one bank Active - Precharge): tRC = tRC (min); tCK = tCK (min); DQ, DM, and DQS inputs changing once per clock cycle; Address and control inputs changing once every two clock cycles; CS = high between valid commands. IDD0 Operating Current (one bank Active - Read - Precharge): One bank open; BL = 4; tRC = tRC (min); tCK = tCK (min); IOUT = 0mA; Address and control inputs changing once per deselect cycle; CS = high between valid commands IDD1 2 Precharge Power-down Standby Current: All banks idle; Power-down mode; tCK = tCK (min); CKE ≤ VIL(max); VIN = VREF for DQ, DQS and DM. IDD2P Precharge Floating Standby Current: CS ≥ VIH(min); All banks idle; CKE ≥ VIH(min); tCK = tCK (min); Address and other control inputs changing once per clock cycle; VIN = VREF for DQ, DQS, and DM. IDD2F Precharge Quiet Standby Current: CS ≥ VIH(min); All banks idle; CKE ≥ VIH(min); tCK = tCK (min); Address and other control inputs stable at ≥ VIH(min) or ≤ VIL(max); VIN = VREF for DQ, DQS, and DM. IDD2Q Active Power-down Standby Current: One bank active; Power-down mode; CKE ≤ VIL(max); tCK = tCK (min); VIN = VREF for DQ, DQS, and DM. IDD3P Active Standby Current: CS ≥ VIH(min); CKE ≥ VIH(min); One bank active; tRC = tRAS (max); tCK = tCK (min); DQ, DM, and DQS inputs changing twice per clock cycle; Address and other control inputs changing once per clock cycle. IDD3N Operating Current (burst read): BL = 2; Continuous burst reads; One bank active; Address and control inputs changing once per clock cycle; tCK = tCK (min); IOUT = 0mA; 50% of data changing on every transfer. IDD4R Operating Current (burst write): BL = 2; Continuous burst writes; One bank active; Address and control inputs changing once per clock cycle; tCK = tCK (min); DQ, DM, and DQS inputs changing twice per clock cycle; 50% of input data changing at every transfer. IDD4W Auto Refresh Current: tRC = tRFC(min) IDD5 Self Refresh Current: CKE ≤ 0.2V; external clock on; tCK = tCK (min) IDD6 1 Operating Current (Four bank operation): Four-bank interleaving READs (burst = 4) with auto precharge; tRC = tRC (min); tCK = tCK (min); Address and control inputs change only during ACTIVE, READ, or WRITE commands; IOUT = 0mA. IDD7 2 Notes: 1. Enable on-chip refresh and address counters. 2. Random address is changing; 50% of data is changing at every transfer. |
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