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LTC2206 Datasheet(PDF) 18 Page - Linear Technology |
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LTC2206 Datasheet(HTML) 18 Page - Linear Technology |
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18 / 32 page  LTC2207/LTC2206 18 22076fc SAMPLE/HOLD OPERATION AND INPUT DRIVE Sample/Hold Operation Figure 2 shows an equivalent circuit for the LTC2207/ LTC2206 CMOS differential sample and hold. The differ- ential analog inputs are sampled directly onto sampling capacitors (CSAMPLE) through NMOS transistors. The capacitors shown attached to each input (CPARASITIC) are the summation of all other capacitance associated with each input. During the sample phase when ENC is low, the NMOS transistors connect the analog inputs to the sampling capacitors and they charge to, and track the differential input voltage. When ENC transitions from low to high, the sampled input voltage is held on the sampling capacitors. During the hold phase when ENC is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the ADC core for processing. As ENC transitions for high to low, the inputs are reconnected to the sampling capacitors to acquire a new sample. Since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. If the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. If the input change is large, such as the change seen with input frequencies near Nyquist, then a larger charging glitch will be seen. Common Mode Bias The ADC sample-and-hold circuit requires differential drive to achieve specified performance. Each input should swing ±0.5625Vforthe2.25Vrange(PGA=0)or±0.375V for the 1.5V range (PGA = 1), around a common mode voltage of 1.25V. The VCM output pin (Pin 2) is designed to provide the common mode bias level. VCM can be tied directly to the center tap of a transformer to set the DC input level or as a reference level to an op amp differential driver circuit. The VCM pin must be bypassed to ground close to the ADC with 2.2μF or greater. Input Drive Impedence As with all high performance, high speed ADCs the dynamic performance of the LTC2207/LTC2206 can be influenced by the input drive circuitry, particularly the second and third harmonics. Source impedance and in- put reactance can influence SFDR. At the falling edge of ENC the sample-and-hold circuit will connect the 4.9pF sampling capacitor to the input pin and start the sampling period. The sampling period ends when ENC rises, hold- ing the sampled input on the sampling capacitor. Ideally, the input circuitry should be fast enough to fully charge the sampling capacitor during the sampling period 1/(2FENCODE); however, this is not always possible and the incomplete settling may degrade the SFDR. The sampling glitch has been designed to be as linear as possible to minimize the effects of incomplete settling. For the best performance it is recommended to have a source impedence of 100 Ω or less for each input. The source impedence should be matched for the differential inputs. Poor matching will result in higher even order harmonics, especially the second. APPLICATIONS INFORMATION Figure 2. Equivalent Input Circuit CSAMPLE 4.9pF VDD VDD LTC2207/LTC2206 AIN+ 22076 F02 CSAMPLE 4.9pF VDD AIN– ENC– ENC+ 1.6V 6k 1.6V 6k CPARASITIC 1.8pF CPARASITIC 1.8pF |
Similar Part No. - LTC2206_15 |
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Similar Description - LTC2206_15 |
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