CDCL1810A

SLLSEL1 – NOVEMBER 2014

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8 Specifications

8.1 Absolute Maximum Ratings

(1)

Over operating free-air temperature range (unless otherwise noted).

MIN

MAX

UNIT

–0.3

2.5

V

–0.3

VDD+0.6

V

–0.3

VDD+0.6

V

Junction temperature

+125

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

condition is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to network ground terminal.

8.2 Handling Ratings

MIN

MAX

UNIT

Storage temperature range

–65

+150

°C

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all

2000

Electrostatic discharge

V

Charged device model (CDM), per JEDEC specification

500

(1)

JEDEC document JEP155 states that 2000-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 500-V CDM allows safe manufacturing with a standard ESD control process.

8.3 Recommended Operating Conditions

Over operating free-air temperature range (unless otherwise noted).

MIN

NOM

MAX

UNIT

Digital supply voltage

1.7

1.8

1.9

V

Analog supply voltage

1.7

1.8

1.9

V

Ambient temperature (no airflow, no heatsink)

–40

+85

°C

Junction temperature

+105

°C

8.4 Thermal Information

CDCL1810A

RGZ

UNIT

48 PINS

28.3, Airflow = 0 LFM

22.4, Airflow = 50 LFM

°C/W

Junction-to-case (top) thermal resistance

20.5

Junction-to-case (bottom) thermal resistance

5.3

(1)

For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.

(2)

No heatsink; power uniformly distributed; 36 ground vias (6 x 6 array) tied to the thermal exposed pad; 4-layer high-K board.

6

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