970

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Specifications CD4066BMS

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

Group A

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1 (Note 1)

2, 3, 9, 10

1, 4-8, 11-13

14

Static Burn-In 2 (Note 1)

2, 3, 9, 10

7

1, 4-6, 8, 11-14

Dynamic Burn-In (Note 1)

-

7

14

2, 3, 9, 10

5, 6, 12, 13

1, 4, 8, 11

Irradiation (Note 2)

2, 3, 9, 10

7

1, 4-6, 8, 11-14

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD

= 10V

± 0.5V

Functional Diagram

TRUTH TABLE EACH SWITCH

INPUT

OUTPUT

VC

VIS

VOS

100

111

0

0

Open

0

1

Open

Positive Logic: Switch ON VC = “1”

Switch OFF VC = “0”

TABLE 6. APPLICABLE SUBGROUPS

(Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

IN/OUT

OUT/IN

OUT/IN

IN/OUT

CONTROL B

CONTROL C

VSS

VDD

CONTROL A

CONTROL D

IN/OUT

OUT/IN

OUT/IN

IN/OUT

1

2

3

4

5

6

7

14

13

12

11

10

9

8

SW

A

SIG A

SW

D

SW

B

SW

C

SIG B

SIG C

SIG D