AD5310

Data Sheet

Rev. B | Page 10 of 16

TERMINOLOGY

Relative Accuracy

For the DAC, relative accuracy or integral nonlinearity (INL) is

a measure of the maximum deviation, in LSBs, from a straight

line passing through the endpoints of the DAC transfer function.

A typical INL vs. code plot is shown in Figure 5.

Differential Nonlinearity

Differential nonlinearity (DNL) is the difference between the

measured change and the ideal 1 LSB change between any two

adjacent codes. A specified differential nonlinearity of ±1 LSB

maximum ensures monotonicity. This DAC is guaranteed mono-

tonic by design. A typical DNL vs. code plot is shown in Figure 6.

Zero Code Error

Zero code error is a measure of the output error when zero code

(000 hex) is loaded to the DAC register. Ideally, the output should

be 0 V. The zero code error is always positive in the AD5310

because the output of the DAC cannot go below 0 V. It is due to

a combination of the offset errors in the DAC and output amplifier.

Zero code error is expressed in mV. A plot of zero code error vs.

temperature is shown in Figure 9.

Full-Scale Error

Full-scale error is a measure of the output error when full-scale

code (3FF Hex) is loaded to the DAC register. Ideally, the output

of the full-scale range. A plot of full-scale error vs. temperature

is shown in Figure 9.

Gain Error

Gain error is a measure of the span error of the DAC. It is the

deviation in slope of the DAC transfer characteristic from the

ideal expressed as a percentage of the full-scale range.

Total Unadjusted Error

Total unadjusted error (TUE) is a measure of the output error

that takes all the various errors into account. A typical TUE vs.

code plot is shown in Figure 7.

Zero Code Error Drift

Zero code error drift is a measure of the change in zero code

error with a change in temperature. It is expressed in µV/°C.

Gain Error Drift

Gain error drift is a measure of the change in gain error with

changes in temperature. It is expressed in (ppm of full-scale

range)/°C.

Digital-to-Analog Glitch Impulse

Digital-to-analog glitch impulse is the impulse injected into the

analog output when the input code in the DAC register changes

state. It is normally specified as the area of the glitch in nV-s and

is measured when the digital input code is changed by 1 LSB at

the major carry transition (1FF hex to 200 hex). See Figure 22.

Digital Feedthrough

Digital feedthrough is a measure of the impulse injected into the

analog output of the DAC from the digital inputs of the DAC

but is measured when the DAC output is not updated. It is specified

in nV-s and is measured with a full-scale code change on the

data bus, that is, from all 0s to all 1s and vice versa.