GM71C(S)17403C/CL

Rev 0.1 / Apr’01

In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying

The 16M DRAM offers a 16-bit time saving parallel test mode. Address CA0 and CA1 for the

4M x 4 are don't care during test mode. Test mode is set by performing a WE-and-CAS-before-

RAS (WCBR) cycle. In 16-bit parallel test mode, data is written into 4 bits in parallel at each I/O

(I/O1 to I/O4) and read out from each I/O. If 4 bits of each I/O are equal (all 1s or 0s), data

output pin is high state during test mode read cycle, then the device has passed. If they are not

equal, data output pin is a low state, then the device has failed. Refresh during test mode

operation can be performed by normal read cycles or by WCBR refresh cycles. To get out of test

mode and enter a normal operation mode, perform either a regular CAS-before-RAS refresh

cycle or RAS-only refresh cycle.

In a test mode read cycle, the value of

specified value. These parameters should be specified in test mode cycles by adding the above

value to the specified value in this data sheet.

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