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HSDL-1001 Datasheet(PDF) 8 Page - Agilent(Hewlett-Packard) |
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HSDL-1001 Datasheet(HTML) 8 Page - Agilent(Hewlett-Packard) |
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8 / 8 page  Appendix A. Test Methods A.1. Background Light and Electromagnetic Field There are four ambient interference conditions in which the receiver is to operate correctly. The conditions are to be applied separately: 1. Electromagnetic field: 3 V/m maximum (refer to IEC 801-3. severity level 3 for details) 2. Sunlight: 10 kilolux maximum at the optical port This is simulated with an IR source having a peak wavelength within the range 850 nm to 900 nm and a spectral width less than 50 nm biased to provide 490 µW/cm2 (with no modula- tion) at the optical port. The light source faces the optical port. This simulates sunlight within the IrDA spectral range. The effect of longer wavelength radiation is covered by the incandescent condition. 3. Incandescent Lighting: 1000 lux maximum This is produced with general service, tungsten-filament, gas- filled, inside-frosted lamps in the 60 Watt to 150 Watt range to generate 1000 lux over the horizontal surface on which the equipment under test rests. The light sources are above the test area. The source is expected to have a filament temperature in the 2700 to 3050 degrees Kelvin range and a spectral peak in the 850 nm to 1050 nm range. 4. Fluorescent Lighting: 1000 lux maximum This is simulated with an IR source having a peak wavelength within the range 850 nm to 900 nm and a spectral width of less than 50 nm biased and modulated to provide an optical square wave signal (0 µW/cm2 minimum and 0.3 µW/cm2 peak amplitude with 10% to 90% rise and fall times less than or equal to 100 ns) over the horizontal surface on which the equipment under test rests. The light sources are above the test area. The frequency of the optical signal is swept over the frequency range from 20 kHz to 200 kHz. Due to the variety of fluorescent lamps and the range of IR emissions, this condition is not expected to cover all circum- stances. It will provide a common floor for IrDA operation. www.semiconductor.agilent.com Data subject to change. Copyright © 1999 Agilent Technologies Inc. 5965-5363E (11/99) |
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