6

2SK2723

REFERENCE

Document Name

Document No.

NEC semiconductor device reliability/quality control system.

TEI-1202

Quality grade on NEC semiconductor devices.

IEI-1209

Semiconductor device mounting technology manual.

C10535E

Semiconductor device package manual.

C10943X

Guide to quality assurance for semiconductor devices.

MEI-1202

Semiconductor selection guide.

X10679E

Power MOS FET features and application switching power supply.

TEA-1034

Application circuits using Power MOS FET.

TEA-1035

Safe operating area of Power MOS FET.

TEA-1037