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FDPF8N50NZ Datasheet(PDF) 4 Page - Fairchild Semiconductor |
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FDPF8N50NZ Datasheet(HTML) 4 Page - Fairchild Semiconductor |
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4 / 14 page  Qualification Plan Device Package Process No. of Lots Q20120257 FDA59N25 TT3P0003 UniFET1 150~250V 3 Reliability Test Condition Standard Device Name FDA59N25 FDA59N25 FDA59N25 Lot No. Q20120257AA Q20120257AB Q20120257AC Duration Result/FA Result/FA Result/FA HTGB 100 % Rated VGS, Tj max=150C JESD22- A108 1000hrs 0/77 0/77 0/77 HTRB 80% of Rated BV, Tj max=150C JESD22- A108 1000hrs 0/77 0/77 0/77 HTSL 150 C JESD22- A103 1000hrs 0/77 0/77 0/77 HAST 130 C, 85% RH, Vds=42V JESD22- A110 96hrs 0/77 0/77 0/77 PRCL Delta 100C, 5 min on, 3.5 min off MIL-STD- 750-1036 6000 cycles 0/77 0/77 0/77 RSDH 260C JESD22- B106 10sec 0/30 0/30 0/30 TMCL -65 C to 150 C, 30 min/ cycles JESD22- A104 500 cycles 0/77 0/77 0/77 4 of 14 |
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