5

0456H–FLASH–2/05

AT29C512

4.7

DATA Polling

The AT29C512 features DATA polling to indicate the end of a program cycle. During a program

cycle an attempted read of the last byte loaded will result in the complement of the loaded data

on I/O7. Once the program cycle has been completed, true data is valid on all outputs and the

next cycle may begin. DATA polling may begin at any time during the program cycle.

4.8

Toggle Bit

In addition to DATA polling the AT29C512 provides another method for determining the end of a

program or erase cycle. During a program or erase operation, successive attempts to read data

from the device will result in I/O6 toggling between one and zero. Once the program cycle has

completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin

at any time during a program cycle.

4.9

Optional Chip Erase Mode

The entire device can be erased by using a 6-byte software code. Please see Software Chip

Erase application note for details.

5.

Absolute Maximum Ratings*

Temperature Under Bias................................ -55

°C to +125°C

*NOTICE:

Stresses beyond those listed under “Absolute

Maximum Ratings” may cause permanent dam-

age to the device. This is a stress rating only and

functional operation of the device at these or any

other conditions beyond those indicated in the

operational sections of this specification is not

implied. Exposure to absolute maximum rating

conditions for extended periods may affect

device reliability.

Storage Temperature ..................................... -65

°C to +150°C

All Input Voltages

(including NC Pins)

with Respect to Ground ...................................-0.6V to +6.25V

All Output Voltages

Voltage on OE

with Respect to Ground ...................................-0.6V to +13.5V