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AM29LV800B Datasheet(PDF) 26 Page - Advanced Micro Devices |
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AM29LV800B Datasheet(HTML) 26 Page - Advanced Micro Devices |
26 / 42 page 26 Am29LV800B P R E L I M I NARY TEST CONDITIONS Table 7. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test 21490E-15 Figure 11. Test Setup Note: Diodes are IN3064 or equivalent Test Condition 70R, 80 90, 120 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V KS000010-PAL WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input 21490E-16 Figure 12. Input Waveforms and Measurement Levels |
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