AD5662ARJ-1REEL7 datasheet(13/24 Pages) AD

Part #	AD5662ARJ-1REEL7

Description	16-Bit nanoDAC in a SOT-23

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Manufacturer	AD [Analog Devices]

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AD5662

Rev. A | Page 13 of 24

TERMINOLOGY

Relative Accuracy or Integral Nonlinearity (INL)

For the DAC, relative accuracy or integral nonlinearity is a

measurement of the maximum deviation, in LSBs, from a

straight line passing through the endpoints of the DAC transfer

function. A typical INL vs. code plot can be seen in Figure 4.

Differential Nonlinearity (DNL)

Differential nonlinearity is the difference between the measured

change and the ideal 1 LSB change between any two adjacent

codes. A specified differential nonlinearity of ±1 LSB maximum

ensures monotonicity. This DAC is guaranteed monotonic by

design. A typical DNL vs. code plot can be seen in Figure 5.

Zero-Code Error

Zero-code error is a measurement of the output error when

zero code (0x0000) is loaded to the DAC register. Ideally, the

output should be 0 V. The zero-code error is always positive in

the AD5662 because the output of the DAC cannot go below

0 V. It is due to a combination of the offset errors in the DAC

and the output amplifier. Zero-code error is expressed in mV. A

plot of zero-code error vs. temperature can be seen in Figure 11.

Full-Scale Error

Full-scale error is a measurement of the output error when full-

scale code (0xFFFF) is loaded to the DAC register. Ideally, the

output should be VDD − 1 LSB. Full-scale error is expressed in

percent of full-scale range. A plot of full-scale error vs.

temperature can be seen in Figure 10.

Gain Error

This is a measure of the span error of the DAC. It is the deviation

in slope of the DAC transfer characteristic from ideal expressed

as a percent of the full-scale range.

Total Unadjusted Error (TUE)

Total unadjusted error is a measurement of the output error,

taking all the various errors into account. A typical TUE vs.

code plot can be seen in Figure 6.

Zero-Code Error Drift

This is a measurement of the change in zero-code error with a

change in temperature. It is expressed in μV/°C.

Gain Temperature Coefficient

This is a measurement of the change in gain error with changes

in temperature. It is expressed in (ppm of full-scale range)/°C.

Offset Error

Offset error is a measure of the difference between VOUT (actual)

and VOUT (ideal) expressed in mV in the linear region of the

transfer function. Offset error is measured on the AD5662 with

Code 512 loaded in the DAC register. It can be negative or positive.

DC Power Supply Rejection Ratio (PSRR)

This indicates how the output of the DAC is affected by changes

in the supply voltage. PSRR is the ratio of the change in VOUT to a

change in VDD for full-scale output of the DAC. It is measured in

dB. VREF is held at 2 V, and VDD is varied by ±10%.

Output Voltage Settling Time

This is the amount of time it takes for the output of a DAC to settle

to a specified level for a ¼ to ¾ full-scale input change and is

measured from the 24th falling edge of SCLK.

Digital-to-Analog Glitch Impulse

Digital-to-analog glitch impulse is the impulse injected into the

analog output when the input code in the DAC register changes

state. It is normally specified as the area of the glitch in nV-s,

and is measured when the digital input code is changed by

1 LSB at the major carry transition (0x7FFF to 0x8000). See

Figure 25 and Figure 26.

Digital Feedthrough

Digital feedthrough is a measure of the impulse injected into

the analog output of the DAC from the digital inputs of the

DAC, but is measured when the DAC output is not updated. It

is specified in nV-s, and measured with a full-scale code change

on the data bus, that is, from all 0s to all 1s and vice versa.

Total Harmonic Distortion (THD)

This is the difference between an ideal sine wave and its attenuated

version using the DAC. The sine wave is used as the reference for

the DAC, and the THD is a measurement of the harmonics present

on the DAC output. It is measured in dB.

Noise Spectral Density

This is a measurement of the internally generated random noise.

Random noise is characterized as a spectral density (voltage per

√Hz). It is measured by loading the DAC to midscale and meas-

uring noise at the output. It is measured in nV/√Hz. A plot of

noise spectral density can be seen in Figure 31.

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