OPA317

OPA2317

OPA4317

SBOS682A – MAY 2013 – REVISED JUNE 2013

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

VALUE

UNIT

+7

V

(V–) –0.3 to (V+) + 0.3

V

±10

mA

Continuous

Operating temperature

–40 to +150

°C

Storage temperature

–65 to +150

°C

Junction temperature

+150

°C

Human body model (HBM)

4000

V

Electrostatic

discharge (ESD)

Charged device model (CDM)

1000

V

ratings:

Machine model (MM)

400

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.3 V beyond the supply rails should

be current limited to 10 mA or less.

(3)

Short-circuit to ground, one amplifier per package.

2

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Product Folder Links: OPA317 OPA2317 OPA4317