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CD4049 Datasheet(PDF) 5 Page - Rochester Electronics |
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CD4049 Datasheet(HTML) 5 Page - Rochester Electronics |
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5 / 7 page  CD4049/CD4050 Specification Number CD4049_50UB-M-(N) REV - Page 5 of 7 DC Electrical Characteristics CD4049UBCCD4050BC (Note 2) (Continued) Symbol Parameter Conditions b40 C a25 C a85 C Units Min Max Min Typ Max Min Max IOL Low Level Output Current VIH e VDD VIL e 0V (Note 3) VDD e 5V VO e 04V 46 40 5 32 mA VDD e 10V VO e 05V 98 85 12 68 mA VDD e 15V VO e 15V 29 25 40 20 mA IOH High Level Output Current VIH e VDD VIL e 0V (Note 3) VDD e 5V VO e 46V b10 b09 b16 b072 mA VDD e 10V VO e 95V b21 b19 b36 b15 mA VDD e 15V VO e 135V b71 b62 b12 b5 mA IIN Input Current VDD e 15V VIN e 0V b03 b03 b10b5 b10 mA VDD e 15V VIN e 15V 03 03 10b5 10 mA AC Electrical Characteristics CD4049UBMCD4049UBC TA e 25 C CL e 50 pF RL e 200k tr e tf e 20 ns unless otherwise specified Symbol Parameter Conditions Min Typ Max Units tPHL Propagation Delay Time VDD e 5V 30 65 ns High-to-Low Level VDD e 10V 20 40 ns VDD e 15V 15 30 ns tPLH Propagation Delay Time VDD e 5V 45 85 ns Low-to-High Level VDD e 10V 25 45 ns VDD e 15V 20 35 ns tTHL Transition Time VDD e 5V 30 60 ns High-to-Low Level VDD e 10V 20 40 ns VDD e 15V 15 30 ns tTLH Transition Time VDD e 5V 60 120 ns Low-to-High Level VDD e 10V 30 55 ns VDD e 15V 25 45 ns CIN Input Capacitance Any Input 15 225 pF AC Parameters are guaranteed by DC correlated testing AC Electrical Characteristics CD4050BMCD4050BC TA e 25 C CL e 50 pF RL e 200k tr e tf e 20 ns unless otherwise specified Symbol Parameter Conditions Min Typ Max Units tPHL Propagation Delay Time VDD e 5V 60 110 ns High-to-Low Level VDD e 10V 25 55 ns VDD e 15V 20 30 ns tPLH Propagation Delay Time VDD e 5V 60 120 ns Low-to-High Level VDD e 10V 30 55 ns VDD e 15V 25 45 ns tTHL Transition Time VDD e 5V 30 60 ns High-to-Low Level VDD e 10V 20 40 ns VDD e 15V 15 30 ns tTLH Transition Time VDD e 5V 60 120 ns Low-to-High Level VDD e 10V 30 55 ns VDD e 15V 25 45 ns CIN Input Capacitance Any Input 5 75 pF AC Parameters are guaranteed by DC correlated testing 4 |
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