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LM35DZ Datasheet(PDF) 4 Page - Texas Instruments |
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LM35DZ Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 25 page  LM35 SNIS159C – AUGUST 1999 – REVISED JULY 2013 www.ti.com ELECTRICAL CHARACTERISTICS (1)(2) (continued) LM35A LM35CA UNITS PARAMETER TEST CONDITIONS TYP TESTED DESIGN TYP TESTED DESIGN (MAX.) LIMIT(3) LIMIT(4) LIMIT(3) LIMIT(4) VS = 5 V, 25°C 56 67 56 67 VS = 5 V 105 131 91 114 Quiescent current(8) µA VS = 30 V, 25°C 56.2 68 56.2 68 VS = 30 V 105.5 133 91.5 116 4 V ≤ VS ≤ 30 V, 25°C 0.2 1 0.2 1 Change of quiescent µA current(7) 4 V ≤ VS ≤ 30 V 0.5 2 0.5 2 Temperature +0.39 +0.5 +0.39 +0.5 coefficient of µA/°C quiescent current Minimum temperature In circuit of Figure 1, IL = 0 +1.5 +2 +1.5 +2 °C for rate accuracy Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C (8) Quiescent current is defined in the circuit of Figure 1. ELECTRICAL CHARACTERISTICS (1) (2) LM35 LM35C, LM35D UNITS PARAMETER TEST CONDITIONS TYP TESTED DESIGN TYP TESTED DESIGN (MAX.) LIMIT(3) LIMIT(4) LIMIT(3) LIMIT(4) TA = 25°C ±0.4 ±1 ±0.4 ±1 TA = –10°C ±0.5 ±0.5 ±1.5 Accuracy, LM35, °C LM35C(5) TA = TMAX ±0.8 ±1.5 ±0.8 ±1.5 TA = TMIN ±0.8 ±1.5 ±0.8 ±2 TA = 25°C ±0.6 ±1.5 Accuracy, LM35D(5) TA = TMAX ±0.9 ±2 °C TA = TMIN ±0.9 ±2 Nonlinearity(6) TMIN ≤ TA ≤ TMAX ±0.3 ±0.5 ±0.2 ±0.5 °C Sensor gain TMIN ≤ TA ≤ TMAX +10 +9.8, +10 +9.8, mV/°C (average slope) +10.2 +10.2 TA = 25°C ±0.4 ±2 ±0.4 ±2 Load regulation(7) mV/mA 0 ≤ IL ≤ 1 mA TMIN ≤ TA ≤ TMAX ±0.5 ±5 ±0.5 ±5 TA = 25°C ±0.01 ±0.1 ±0.01 ±0.1 Line regulation(7) mV/V 4 V ≤ VS ≤ 30 V ±0.02 ±0.2 ±0.02 ±0.2 (1) Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Figure 2. These specifications also apply from +2°C to TMAX in the circuit of Figure 1. Specifications in boldface apply over the full rated temperature range. (2) Specifications in boldface apply over the full rated temperature range. (3) Tested Limits are ensured and 100% tested in production. (4) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (5) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (6) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (7) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. 4 Submit Documentation Feedback Copyright © 1999–2013, Texas Instruments Incorporated Product Folder Links: LM35 |
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