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S29AL008J70BFI020 Datasheet(PDF) 40 Page - SPANSION |
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S29AL008J70BFI020 Datasheet(HTML) 40 Page - SPANSION |
40 / 54 page 40 S29AL008J S29AL008J_00_11 April 12, 2012 Da ta Sh e e t 15. Test Conditions Figure 15.1 Test Setup Note Diodes are IN3064 or equivalent. 16. Key to Switching Waveforms Figure 16.1 Input Waveforms and Measurement Levels Table 15.1 Test Specifications Test Condition 70 55 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5ns Input Pulse Levels 0.0 or VCC V Input timing measurement reference levels 0.5 VCC Output timing measurement reference levels 0.5 VCC 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) V CC 0.0 V 0.5 V CC Output Measurement Level Input 0.5 V CC |
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