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PCM2906B Datasheet(PDF) 2 Page - Texas Instruments |
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PCM2906B Datasheet(HTML) 2 Page - Texas Instruments |
2 / 30 page ![]() ABSOLUTE MAXIMUM RATINGS (1) PCM2906B SLES227 – DECEMBER 2008 ........................................................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGING/ORDERING INFORMATION(1) SPECIFIED TRANSPORT PACKAGE TEMPERATURE PACKAGE ORDERING MEDIA, PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY PCM2906BDB Rails, 47 PCM2906BDB SSOP-28 DB –25°C to +85°C PCM2906B Tape and Reel, PCM2906BDBR 2000 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. Over operating free-air temperature range (unless otherwise noted). PARAMETER PCM2906B UNIT Supply voltage, VBUS –0.3 to 6.5 V Ground voltage differences, AGNDC, AGNDP, AGNDX, DGND, DGNDU ±0.1 V SEL0, SEL1, DIN –0.3 to 6.5 Digital input V voltage D+, D–, HID0, HID1, HID2, XTI, XTO, DOUT, SSPND –0.3 to (VDDI + 0.3) < 4 VINL, VINR, VCOM, VOUTR, VOUTL –0.3 to (VCCCI + 0.3) < 4 Analog input V voltage VCCCI, VCCP1I, VCCP2I, VCCXI, VDDI –0.3 to 4 Input current (any pins except supplies) ±10 mA Ambient temperature under bias –40 to +125 °C Storage temperature, Tstg –55 to +150 °C Junction temperature, TJ +150 °C Lead temperature (soldering, 5s) +260 °C Package temperature (IR reflow, peak) +250 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): PCM2906B Not Recommended for New Designs |
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