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ISO7221C-HT Datasheet(PDF) 2 Page - Texas Instruments

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Part # ISO7221C-HT
Description  DUAL DIGITAL ISOLATOR
Download  16 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ISO7221C-HT Datasheet(HTML) 2 Page - Texas Instruments

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Input
+
Filter
GalvanicIsolation
Barrier
Vref
Vref
DataMUX
OUT
IN
OSC
+
PWM
ACDetect
OutputBuffer
DCChannel
ACChannel
Filter
PulseWidth
Demodulation
CarrierDetect
ISO7221C-HT
SLLSE78
– APRIL 2011
www.ti.com
This device requires two supply voltages of 3.3 V, 5 V, or any combination. All inputs are 5-V tolerant when
supplied from a 3.3-V supply and all outputs are 4-mA CMOS.
The ISO7221 is characterized for operation over the ambient temperature range of
–55°C to 175°C.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
SINGLE-CHANNEL FUNCTION DIAGRAM
AVAILABLE OPTIONS(1)
MAX
INPUT
MARKED
ORDERING
PRODUCT
SIGNALING
PACKAGE(2)
THRESHOLD
AS
NUMBER
RATE
≉ 1.5 V (TTL)
ISO7221C
25 Mbps
SOIC-8
I7221H
ISO7221CHD
(CMOS compatible)
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2)
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
REGULATORY INFORMATION
UL
Recognized under 1577 Component Recognition Program(1)
File Number: E181974
(1)
Production tested
≥3000 VRMS for 1 second in accordance with UL
1577.
ABSOLUTE MAXIMUM RATINGS
(1)
VALUE
UNIT
VCC
Supply voltage(2), VCC1, VCC2
–0.5 to 6
V
VI
Voltage at IN, OUT
–0.5 to 6
V
IO
Output current
±15
mA
Electrostatic discharge JEDEC Standard
Human Body Model
±4
22, Test Method A114-C.01
kV
Electrostatic
ESD
Field-Induced-Charged Device
All pins
discharge
JEDEC Standard 22, Test Method C101
±1
Model
Machine Model
ANSI/ESDS5.2-1996
±200
V
TJ
Maximum junction temperature
180
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values.
2
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Copyright
© 2011, Texas Instruments Incorporated
Product Folder Link(s) :ISO7221C-HT


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