V

IL

V

IH

V

th

V

th

IN

IN

V

IHmax

V

ILmax

V

IHmin

V

ILmin

V

IH

V

IL

V

th

V

th

V

thmax

V

thmin

GND

V

CC

LVPECL

V

CC

V

CC

130 W

82 W

130 W

82 W

CDCLVP1216

CDCLVP1216

SCAS877C

– MAY 2009 – REVISED AUGUST 2011

www.ti.com

TEST CONFIGURATIONS

This section describes the function of each block for the CDCLVP1216. Figure 3 through Figure 9 illustrate how

the device should be setup for a variety of test configurations.

Figure 3. DC-Coupled LVCMOS Input During Device Test

Figure 5. DC-Coupled LVPECL Input During Device Test

8

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© 2009–2011, Texas Instruments Incorporated

Product Folder Link(s): CDCLVP1216