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CDCM6208V1RGZT Datasheet(PDF) 21 Page - Texas Instruments |
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CDCM6208V1RGZT Datasheet(HTML) 21 Page - Texas Instruments |
21 / 78 page CDCM6208 LVCMOS Phase Noise/ Spectrum Analyzer 50 CDCM6208 LVCMOS Oscilloscope High impedance probe 1mA CDCM6208 LVCMOS Oscilloscope High impedance probe 1mA VDD_Yx CDCM6208 LVCMOS 5pF Oscilloscope High impedance probe (spur/20) 12 p-p CLK [(2 x 10 Deterministic Jitter (ps ) = (π x f )] x 10 CDCM6208 www.ti.com SCAS931A – MAY 2012 – REVISED JUNE 2012 The DJ due to PSRR can be estimated using Equation 1: (1) Example: Therefore, if 100 mV noise with a frequency of 10 kHz were observed at the output supply, the according output jitter for a 122.88 MHz output signal with LVDS signaling could be estimated with DJ = 0.7ps. spacer TYPICAL CHARACTERISTICS This section describes the characterization test setup of each block in the CDCM6208. Figure 9. LVCMOS Output AC Configuration During Device Test (VOH, VOL, tSLEW) Figure 10. LVCMOS Output DC Configuration During Device Test Figure 11. LVCMOS Output AC Configuration During Device Phase Noise Test Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 21 Product Folder Link(s): CDCM6208 |
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