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74HC4066D Datasheet(PDF) 20 Page - NXP Semiconductors |
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74HC4066D Datasheet(HTML) 20 Page - NXP Semiconductors |
20 / 27 page ![]() 2004 Nov 11 20 Philips Semiconductors Product specification Quad bilateral switches 74HC4066; 74HCT4066 TEST CIRCUIT AND WAVEFORMS handbook, full pagewidth open GND RL Vis VCC VI VO MGR273 D.U.T. CL RT PULSE GENERATOR VCC switch Fig.21 Test circuit for measuring AC performance. TEST SWITCH Vis tPZH GND VCC tPZL VCC GND tPHZ GND VCC tPLZ VCC GND other open pulse Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to the output impedance ZO of the pulse generator. tf = 6 ns; when measuring fmax, there is no constraint to tr and tf with 50 % duty factor. handbook, full pagewidth MGR274 tTHL (tf)tTLH (tr) VM tW positive input pulse negative input pulse 0 V amplitude 90% 10% tTLH (tr)tTHL (tf) VM tW 0 V amplitude 90% 10% Fig.22 Input pulse definitions. FAMILY AMPLITUDE VM tr and tf fmax; PULSE WIDTH OTHER 74HC4066 VCC 50 % <2ns 6 ns 74HCT4066 3.0 V 1.3 V <2ns 6 ns |
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