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2N6660CSM4_0809 Datasheet(PDF) 1 Page - Seme LAB |
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2N6660CSM4_0809 Datasheet(HTML) 1 Page - Seme LAB |
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1 / 2 page ![]() 2N6660CSM4 Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk DOC 7777, ISSUE 2 FEATURES • Faster switching • Low Ciss • Integral Source-Drain Diode • High Input Impedance and High Gain DESCRIPTION This enhancement-mode (normally-off) vertical DMOS FET is ideally suited to a wide range of switching and amplifying applications where high breakdown voltage, high input impedance, low input capacitance, and fast switching speeds are desired. Hi-Reliability Military and Space screening options available N–CHANNEL ENHANCEMENT MODE MOSFET V DSS 60V I D 1.0A R DS(on) 3.0 Ω LCC3 PACKAGE (MO-041BA) (Underside View) PAD 1 – DRAIN PAD 3 – SOURCE PAD 2 – N/C PAD 4 – GATE 1 2 3 4 5.59 ± 0.13 (0.22 ± 0.005) 0.23 (0.009) rad. 1.02 ± 0.20 (0.04 ± 0.008) 2.03 ± 0.20 (0.08 ± 0.008) 1.40 ± 0.15 (0.055 ± 0.006) 0.25 ± 0.03 (0.01 ± 0.001) 0.23 (0.009) min. MECHANICAL DATA Dimensions in mm (inches) ABSOLUTE MAXIMUM RATINGS T CASE = 25°C unless otherwise stated V DS Drain - Source Voltage 60V I D Drain Current - Continuous (T C = 25°C) 1.0A I DM Drain Current - Pulsed (Note 1) 3A V GS Gate - Source Voltage ±20V P tot(1) Total Power Dissipation at T mounting base ≤ 25°C 3.0W De-rate Linearly above 25°C 0.020W/°C P tot(2) Total Power Dissipation at T ambient ≤ 25°C 0.5W T j,Tstg Operating and Storage Junction Temperature Range -55 to +175°C THERMAL DATA R thj-mb Thermal Resistance Junction – Mounting base Max 50 °C/W NOTES: 1) Repetitive Rating: Pulse Width limited by maximum junction temperature. 2) Pulse Test: Pulse Width ≤ 300µS, Duty Cycle , δ 2% |
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