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313079-001 Datasheet(PDF) 79 Page - Intel Corporation |
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313079-001 Datasheet(HTML) 79 Page - Intel Corporation |
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79 / 104 page  Dual-Core Intel® Xeon® Processor 5000 Series Datasheet 79 Thermal Specifications 6.2.6 Tcontrol and Fan Speed Reduction Tcontrol is a temperature specification based on a temperature reading from the thermal diode. The value for Tcontrol will be calibrated in manufacturing and configured for each processor. The Tcontrol value is set identically for both processor cores. The Tcontrol temperature for a given processor can be obtained by reading the IA32_TEMPERATURE_TARGET MSR in the processor. The Tcontrol value that is read from the IA32_TEMPERATURE_TARGET MSR must be converted from Hexadecimal to Decimal and added to a base value of 60 ° C. The value of Tcontrol may vary from 0x00h to 0x1Eh. When Tdiode is above Tcontrol, then TCASE must be at or below TCASE_MAX as defined by the thermal profile. (Refer to Figure 6-1, Figure 6-2 and Figure 6-3 ; Table 6-2, Table 6-3, Table 6-5, Table 6-6 and Table 6-8). Otherwise, the processor temperature can be maintained at or below Tcontrol. 6.2.7 Thermal Diode The Dual-Core Intel Xeon Processor 5000 series incorporates an on-die PNP transistor whose base emitter junction is used as a thermal “diode”, one per core, with its collector shorted to Ground. A thermal sensor located on the system board may monitor the die temperature of the processor for thermal management and fan speed control. Table 6-9, Table 6-11 and Table 6-12 provide the “diode” parameters and interface specifications. Two different sets of “diode” parameters are listed in Table 6-9 and Table 6-11. The Diode Model parameters (Table 6-9) apply to traditional thermal sensors that use the Diode Equation to determine the processor temperature. Transistor Model parameters (Table 6-11) have been added to support thermal sensors that use the transistor equation method. The Transistor Model may provide more accurate temperature measurements when the diode ideality factor is closer to the maximum or minimum limits. This thermal “diode” is separate from the Thermal Monitor’s thermal sensor and cannot be used to predict the behavior of the Thermal Monitor. When calculating a temperature based on thermal diode measurements, a number of parameters must be either measured or assumed. Most devices measure the diode ideality and assume a series resistance and ideality trim value, although some are capable of also measuring the series resistance. Calculating the temperature is then accomplished by using the equations listed under Table 6-9. In most temperature sensing devices, an expected value for the diode ideality is designed-in to the temperature calculation equation. If the designer of the temperature sensing device assumes a perfect diode, the ideality value (also called ntrim) will be 1.000. Given that most diodes are not perfect, the designers usually select an ntrim value that more closely matches the behavior of the diodes in the processor. If the processors diode ideality deviates from that of ntrim, each calculated temperature will be offset by a fixed amount. The temperature offset can be calculated with the equation: Terror(nf) = Tmeasured X (1- nactual/ntrim ) where Terror(nf) is the offset in degrees C, Tmeasured is in Kelvin, nactual is the measured ideality of the diode, and ntrim is the diode ideality assumed by the temperature sensing device. In order to improve the accuracy of diode based temperature measurements, a new register (Tdiode_Offset) has been added to Dual-Core Intel Xeon Processor 5000 series which will contain thermal diode characterization data. During manufacturing each processor’s thermal diode will be evaluated for its behavior relative to a theoretical diode. Using the equation above, the temperature error created by the difference |
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