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CDCE62005 Datasheet(PDF) 66 Page - Texas Instruments |
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CDCE62005 Datasheet(HTML) 66 Page - Texas Instruments |
66 / 80 page DieTemperaturevsTotalDevicePower 0 25 50 75 100 125 0 1 2 3 4 Power(W) JEDEC0LFM25C JEDEC100LFM25C RL 0LFM25C RL 100LFM25C JEDEC0LFM85C JEDEC100LFM85C RL 0LFM85C RL 100LFM85C JEDEC0LFM25C JEDEC100LFM25C RL 0LFM25C JDEC0LFM85C JEDEC100LFM85C RL 0LFM85C RL 100LFM85C RL 100LFM25C CDCE62005 SCAS862C – NOVEMBER 2008 – REVISED FEBRUARY 2010 www.ti.com DEVICE POWER CALCULATION AND THERMAL MANAGEMENT The CDCE62005 is a high performance device, therefore careful attention must be paid to device configuration and printed circuit board layout with respect to power consumption. Table 44 provides the power consumption for the individual blocks within the CDCE62005. To estimate total power consumption, calculate the sum of the products of the number of blocks used and the power dissipated of each corresponding block. Table 44. CDCE62005 Power Consumption Internal Block (Power at 3.3V) Power Dissipated per Block Number of Blocks per Device Input Circuit 250 mW 1 PLL and VCO Core 500 mW 1 Output Divider 185 mW 5 Output Buffer ( LVPECL) 116 mW 5 Output Buffer (LVDS) 76 mW 5 Output Buffer (LVCMOS) 86 mW 10 This power estimate determines the degree of thermal management required for a specific design. Employing the thermally enhanced printed circuit board layout shown in Figure 40 insures that the thermal performance curves shown in Figure 39 apply. Observing good thermal layout practices enables the thermal pad on the backside of the QFN-48 package to provide a good thermal path between the die contained within the package and the ambient air. This thermal pad also serves as the ground connection the device; therefore, a low inductance connection to the ground plane is essential. Figure 40 shows a layout optimized for good thermal performance and a good power supply connection as well. The 7×7 filled via patter facilitates both considerations. Finally, the recommended layout achieves qJA = 27.3°C/W in still air and 20.3°C/W in an environment with 100 LFM airflow if implemented on a JEDEC compliant thermal test board.. Figure 39. CDCE62005 Die Temperature vs Device Power 66 Submit Documentation Feedback Copyright © 2008–2010, Texas Instruments Incorporated Product Folder Link(s) :CDCE62005 |
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