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ZR431F Datasheet(PDF) 6 Page - Zetex Semiconductors |
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ZR431F Datasheet(HTML) 6 Page - Zetex Semiconductors |
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6 / 7 page  IL Input Fig 1 – Test Circuit for V z=Vref DC TEST CIRCUITS Fig 2 – Test Circuit for V z>Vref Input V I Z zoff Fig 3 – Test Circuit for Off State current ZR431 4-194 NOTES Deviation of reference input voltage, Vdev, is defined as the maximum variation of the reference input voltage over the full temperature range. The average temperature coefficient of the reference input voltage, Vref is defined as: Vref ppm °C Vdev x 1000000 Vref T1T2 The dynamic output impedance, Rz, is defined as: RZ VZ IZ When the device is programmed with two external resistors, R1 and R2, (fig 2) , the dynamic output impedance of the overall circuit, R’, is defined as: R’ Rz 1 R1 R2 Vmax Vmin Vdev = Vmax - Vmin 78 |
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