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74HC27 Datasheet(PDF) 8 Page - NXP Semiconductors |
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74HC27 Datasheet(HTML) 8 Page - NXP Semiconductors |
8 / 16 page ![]() 74HC_HCT27_3 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 03 — 7 January 2008 8 of 16 NXP Semiconductors 74HC27; 74HCT27 Triple 3-input NOR gate Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch Fig 7. Load circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open PULSE GENERATOR Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH 74HC27 VCC 6 ns 15 pF, 50 pF 1 k Ω open 74HCT27 3 V 6 ns 15 pF, 50 pF 1 k Ω open |
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