4N29 4N29A 4N30 4N31 4N32 4N33

2

Motorola Optoelectronics Device Data

Characteristic

Symbol

Min

Typ(1)

Max

Unit

INPUT LED

*Reverse Leakage Current (VR = 3 V, RL = 1 M ohms)

IR

—

0.05

100

µA

*Forward Voltage (IF = 10 mA)

VF

—

1.34

1.5

Volts

Capacitance (VR = 0 V, f = 1 MHz)

C

—

1.8

—

pF

OUTPUT DETECTOR (TA = 25°C and IF = 0, unless otherwise noted)

*Collector–Emitter Dark Current

(VCE = 10 V, Base Open)

—

—

100

nA

*Collector–Base Breakdown Voltage

(IC = 100 µA, IE = 0)

V(BR)CBO

30

—

—

Volts

*Collector–Emitter Breakdown Voltage

(IC = 100 µA, IB = 0)

V(BR)CEO

30

—

—

Volts

*Emitter–Collector Breakdown Voltage

(IE = 100 µA, IB = 0)

V(BR)ECO

5

—

—

Volts

DC Current Gain

(VCE = 5 V, IC = 500 µA)

hFE

—

16K

—

—

COUPLED (TA = 25°C unless otherwise noted)

*Collector Output Current (3)

4N32, 4N33

(VCE = 10 V, IF = 10 mA)

4N29, 4N30

4N31

IC (CTR)(2)

50 (500)

10 (100)

5 (50)

—

—

—

—

—

—

mA (%)

Isolation Surge Voltage(4,5)

4N29/A, 4N30, 31, 32, 33

(60 Hz ac Peak, 1 Second)

*4N29, 4N32

*4N30, 4N31, 4N33

VISO

7500

2500

1500

—

—

—

—

—

—

Vac(pk)

Isolation Resistance(4)

(V = 500 V)

RISO

—

1011

—

Ohms

*Collector–Emitter Saturation Voltage(3)

4N31

(IC = 2 mA, IF = 8 mA)

4N29, 4N30, 4N32, 4N33

VCE(sat)

—

—

—

—

1.2

1

Volts

Isolation Capacitance(4)

(V = 0 V, f = 1 MHz)

CISO

—

0.2

—

pF

Turn–On Time(6)

(IC = 50 mA, IF = 200 mA, VCC = 10 V)

ton

—

0.6

5

µs

Turn–Off Time(6)

(IC = 50 mA, IF = 200 mA, VCC = 10 V) 4N29, 30, 31

4N32, 33

toff

—

—

17

45

40

100

µs

* Indicates JEDEC Registered Data. All Motorola 6–pin devices have VISO rating of 7500 Vac(pk).

1. Always design to the specified minimum/maximum electrical limits (where applicable).

2. Current Transfer Ratio (CTR) = IC/IF x 100%.

3. Pulse Test: Pulse Width = 300

µs, Duty Cycle p 2%.

4. For this test, Pins 1 and 2 are common and Pins 4, 5 and 6 are common.

5. Isolation Surge Voltage, VISO, is an internal device dielectric breakdown rating.

6. For test circuit setup and waveforms, refer to Figure 11.