4

5194F–SEEPR–1/08

AT24C1024B

3. Memory Organization

AT24C1024B, 1024K SERIAL EEPROM: The 1024K is internally organized as 512 pages of

256 bytes each. Random word addressing requires a 17-bit data word address.

Note:

1. This parameter is characterized and is not 100% tested.

Note:

Table 3-1.

Pin Capacitance(1)

Symbol

Test Condition

Max

Units

Conditions

Input/Output Capacitance (SDA)

8

pF

6

pF

Table 3-2.

DC Characteristics

Symbol

Parameter

Test Condition

Min

Typ

Max

Units

Supply Voltage

1.8

3.6

V

Supply Voltage

2.5

5.5

V

Supply Current

READ at 400 kHz

2.0

mA

Supply Current

WRITE at 400 kHz

3.0

mA

Standby Current

1.0

µA

3.0

µA

Standby Current

2.0

µA

6.0

µA

Input Leakage Current

0.10

3.0

µA

Output Leakage

Current

0.05

3.0

µA

Input Low Level(1)

–0.6

V

Input High Level(1)

V

Output Low Level

0.2

V

Output Low Level

0.4

V

Table 3-3.

AC Characteristics (Industrial Temperature)

erwise noted). Test conditions are listed in Note 2.

Symbol

Parameter

1.8-volt

2.5, 5.0-volt

Units

Min

Max

Min

Max

Clock Frequency, SCL

400

1000

kHz

Clock Pulse Width Low

1.3

0.4

µs

Clock Pulse Width High

0.6

0.4

µs