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M27C256B Datasheet(PDF) 4 Page - STMicroelectronics |
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M27C256B Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 16 page  M27C256B 4/16 DEVICE OPERATION The operating modes of the M27C256B are listed in the Operating Modes. A single power supply is required in the read mode. All inputs are TTL lev- els except for VPP and 12V on A9 for Electronic Signature. Read Mode The M27C256B has two control functions, both of which must be logically active in order to obtain data at the outputs. Chip Enable (E) is the power control and should be used for device selection. Output Enable (G) is the output control and should be used to gate data to the output pins, indepen- dent of device selection. Assuming that the ad- dresses are stable, the address access time (tAVQV) is equal to the delay from E to output (tELQV). Data is available at the output after delay of tGLQV from the falling edge of G, assuming that E has been low and the addresses have been sta- ble for at least tAVQV-tGLQV. Standby Mode The M27C256B has a standby mode which reduc- es the supply current from 30mA to 100µA. The M27C256B is placed in the standby mode by ap- plying a CMOS high signal to the E input. When in the standby mode, the outputs are in a high imped- ance state, independent of the G input. Table 5. AC Measurement Conditions High Speed Standard Input Rise and Fall Times ≤ 10ns ≤ 20ns Input Pulse Voltages 0 to 3V 0.4V to 2.4V Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V Figure 3. AC Testing Input Output Waveform AI01822 3V High Speed 0V 1.5V 2.4V Standard 0.4V 2.0V 0.8V Figure 4. AC Testing Load Circuit AI01823B 1.3V OUT CL CL = 30pF for High Speed CL = 100pF for Standard CL includes JIG capacitance 3.3k Ω 1N914 DEVICE UNDER TEST Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz) Note: 1. Sampled only, not 100% tested. Symbol Parameter Test Condition Min Max Unit CIN Input Capacitance VIN = 0V 6pF COUT Output Capacitance VOUT = 0V 12 pF |
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