CY7C1020CV26
Document #: 38-05406 Rev. *A
Page 2 of 8
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65
°C to +150°C
Ambient Temperature with
Power Applied............................................. –55
°C to +125°C
Supply Voltage on VCC to Relative GND
[1] .... –0.5V to +4.6V
DC Voltage Applied to Outputs
in High-Z State[1] ......................................–0.5V to VCC+0.5V
DC Input Voltage[1] .................................. –0.5V to VCC+0.5V
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage........................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current..................................................... > 200 mA
Operating Range
Range
Ambient
Temperature
VCC
Automotive
–40
°C to +125°C
2.5V to 2.7V
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
CY7C1020CV26
Unit
Min.
Max.
VOH
Output HIGH Voltage
VCC = Min.,
IOH = –1.0 mA
2.3
V
VOL
Output LOW Voltage
VCC = Min.,
IOL = 1.0 mA
0.4
V
VIH
Input HIGH Voltage
2.0
VCC + 0.3
V
VIL
Input LOW Voltage[1]
–0.3
0.8
V
IIX
Input Load Current
GND < VI < VCC
–5
+5
µA
IOZ
Output Leakage Current
GND < VI < VCC, Output Disabled
–5
+5
µA
IOS
[2]
Output Short Circuit Current
VCC = Max., VOUT = GND
–300
mA
ICC
VCC Operating Supply Current
VCC = Max., IOUT = 0 mA,
f=fMAX = 1/tRC
100
mA
ISB1
Automatic CE Power-Down
Current —TTL Inputs
Max. VCC, CE > VIH
VIN > VIH or VIN < VIL, f = fMAX
40
mA
ISB2
Automatic CE Power-down
Current —CMOS Inputs
Max. VCC,
CE > VCC – 0.3V, VIN > VCC – 0.3V, or
VIN < 0.3V, f = 0
5
mA
Capacitance[3]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
TA = 25°C, f = 1 MHz,
VCC = 2.6V
8
pF
COUT
Output Capacitance
8
pF
Notes:
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
3. Tested initially and after any design or process changes that may affect these parameters.
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