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SM5010 Datasheet(PDF) 10 Page - Nippon Precision Circuits Inc |
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SM5010 Datasheet(HTML) 10 Page - Nippon Precision Circuits Inc |
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10 / 25 page  SM5010 series SEIKO NPC CORPORATION —10 5010CL × series 3V operation: VDD = 2.7 to 3.6V, VSS = 0V, Ta = −20 to +80°C unless otherwise noted. 5V operation: VDD = 4.5 to 5.5V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter Symbol Condition Rating Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA 2.2 2.4 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD –– V LOW-level input voltage VIL INHN – – 0.3VDD V Output leakage current IZ Q: Measurement cct 2, INHN = LOW, VDD = 3.6V VOH = VDD –– 10 µA VOL = VSS –– 10 Current consumption IDD Measurement cct 3, load cct 1, INHN = open, CL = 15pF, f = 30MHz 5010CL1 – 5 10 mA 5010CL2 – 3.5 7 5010CL3 – 2.5 5 5010CL4 – 2 4 5010CL5 – 2 4 Standby current IST Measurement cct 6, INHN = LOW – – 5 µA INHN pull-up resistance RUP1 Measurement cct 4 2 4 15 M Ω RUP2 40 100 250 k Ω Feedback resistance Rf Measurement cct 5 80 200 500 k Ω Built-in capacitance CG Design value. A monitor pattern on a wafer is tested. 16 18 20 pF CD 16 18 20 Parameter Symbol Condition Rating Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 4.5V, IOH = 16mA 4.0 4.2 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 4.5V, IOL = 16mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD –– V LOW-level input voltage VIL INHN – – 0.3VDD V Output leakage current IZ Q: Measurement cct 2, INHN = LOW, VDD = 5.5V VOH = VDD –– 10 µA VOL = VSS –– 10 Current consumption IDD Measurement cct 3, load cct 1, INHN = open, CL = 50pF, f = 30MHz 5010CL1 – 15 30 mA 5010CL2 – 9 18 5010CL3 – 6 12 5010CL4 – 5 10 5010CL5 – 5 10 Standby current IST Measurement cct 6, INHN = LOW – – 10 µA INHN pull-up resistance RUP1 Measurement cct 4 128 M Ω RUP2 40 100 250 k Ω Feedback resistance Rf Measurement cct 5 80 200 500 k Ω Built-in capacitance CG Design value. A monitor pattern on a wafer is tested. 16 18 20 pF CD 16 18 20 |
Similar Part No. - SM5010_06 |
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Similar Description - SM5010_06 |
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