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LIS202DL Datasheet(PDF) 9 Page - STMicroelectronics |
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LIS202DL Datasheet(HTML) 9 Page - STMicroelectronics |
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9 / 36 page  LIS202DL Mechanical and electrical specifications 9/36 2.4 Terminology 2.4.1 Sensitivity Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1g acceleration to it. As the sensor can measure DC accelerations this can be done easily by pointing the axis of interest towards the center of the earth, noting the output value, rotating the sensor by 180 degrees (pointing to the sky) and noting the output value again. By doing so, ±1g acceleration is applied to the sensor. Subtracting the larger output value from the smaller one and dividing the result by 2 leads to the actual sensitivity of the sensor. This value changes very little over temperature and also time. The Sensitivity Tolerance describes the range of Sensitivities of a large population of sensors. 2.4.2 Zero-g level Zero-g level Offset (TyOff) describes the deviation of an actual output signal from the ideal output signal if no acceleration is present. A sensor in a steady state on a horizontal surface will measure 0g in X axis and 0g in Y axis. The output is ideally in the middle of the dynamic range of the sensor (content of OUT registers 00h, data expressed as 2’s complement number). A deviation from ideal value in this case is called Zero-g offset. Offset is to some extent a result of stress to MEMS sensor and therefore the offset can slightly change after mounting the sensor onto a printed circuit board or exposing it to extensive mechanical stress. Offset changes little over temperature, see “Zero-g level change vs. temperature”. The Zero-g level tolerance (TyOff) describes the Standard Deviation of the range of Zero-g levels of a population of sensors. 2.4.3 Self test Self Test allows to check the sensor functionality without moving it. The Self Test function is off when the self-test bit of ctrl_reg1 (control register 1) is programmed to ‘0‘. When the self- test bit of ctrl_reg1 is programmed to ‘1‘ an actuation force is applied to the sensor, simulating a definite input acceleration. In this case the sensor outputs will exhibit a change in their DC levels which are related to the selected full scale through the device sensitivity. When Self Test is activated, the device output level is given by the algebric sum of the signals produced by the acceleration acting on the sensor and by the electrostatic test-force. If the output signals change within the amplitude specified inside Table 3, then the sensor is working properly and the parameters of the interface chip are within the defined specifications. 2.4.4 Click and double click recognition The click and double click recognition functions help to create man-machine interface with little software overload. The device can be configured to output an interrupt signal on dedicated pin when tapped in any direction. If the sensor is exposed to a single input stimulus it generates an interrupt request on inertial interrupt pins (INT1 and/or INT2). A more advanced feature allows to generate an interrupt request when a “double click” stimulus is applied. A programmable time between the two events allows a flexible adoption to the application requirements. Mouse-button like application like clicks and double clicks can be implemented. This function can be fully programmed by the user in terms of expected amplitude and timing of the stimuli. |
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