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SCC2692 Datasheet(PDF) 6 Page - NXP Semiconductors |
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SCC2692 Datasheet(HTML) 6 Page - NXP Semiconductors |
6 / 30 page ![]() Philips Semiconductors Product specification SCC2692 Dual asynchronous receiver/transmitter (DUART) 1998 Sep 04 6 DC ELECTRICAL CHARACTERISTICS1, 2, 3 SYM- PARAMETER TEST CONDITIONS LIMITS UNIT BOL PARAMETER TEST CONDITIONS Min Typ Max UNIT VIL Input low voltage 0.8 V VIH Input high voltage (except X1/CLK)6 2.0 V VIH Input high voltage (except X1/CLK)7 2.5 V VIH Input high voltage (X1/CLK) 0.8 VCC V VOL Output low voltage IOL = 2.4mA 0.4 V VOH Output high voltage (except OD outputs)4 IOH = -400µA VCC -0.5 V IIX1PD X1/CLK input current - power down VIN = 0 to VCC -10 +10 µA IILX1 X1/CLK input low current - operating VIN = 0 -75 0 µA IIHX1 X1/CLK input high current - operating VIN = VCC 0 75 µA IOHX2 X2 output high current - operating VOUT = VCC, X1 = 0 0 +75 µA IOHX2S X2 output high short circuit current - operating VOUT = 0, X1 = 0 -10 -1 mA IOLX2 X2 output low current - operating VOUT = 0, X1 = VCC -75 0 µA IOLX2S X2 output low short circuit current - operating and power down VOUT = VCC, X1 = VCC 1 10 mA Input leakage current: II All except input port pins VIN = 0 to VCC -10 +10 µA Input port pins VIN = 0 to VCC -20 +10 µA IOZH Output off current high, 3-state data bus VIN = VCC 10 µA IOZL Output off current low, 3-state data bus VIN = 0V -10 µA IODL Open-drain output low current in off-state VIN = 0 -10 µA IODH Open-drain output high current in off-state VIN = VCC 10 µA Power supply current5 ICC Operating mode CMOS input levels 10 mA Power down mode8 CMOS input levels 2 10 mA NOTES: 1. Parameters are valid over specified temperature range. 2. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4V and 2.4V with a transition time of 5ns maximum. For X1/CLK this swing is between 0.4V and 4.4V. All time measurements are referenced at input voltages of 0.8V and 2.0V and output voltages of 0.8V and 2.0V, as appropriate. 3. Typical values are at +25 °C, typical supply voltages, and typical processing parameters. 4. Test conditions for outputs: CL = 150pF, except interrupt outputs. Test conditions for interrupt outputs: CL = 50pF, RL = 2.7KΩ to VCC. 5. All outputs are disconnected. Inputs are switching between CMOS levels of VCC -0.2V and VSS + 0.2V. 6. TA > 0°C 7. TA < 0°C 8. See UART application note for 5 µA. AC CHARACTERISTICS1, 2, 4 SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER Min Typ3 Max UNIT Reset Timing (See Figure 3) tRES RESET pulse width 200 ns Bus Timing5 (See Figure 4) tAS A0-A3 setup time to RDN, WRN Low 10 ns tAH A0-A3 hold time from RDN, WRN Low 100 ns tCS CEN setup time to RDN, WRN Low 0 ns tCH CEN hold time from RDN, WRN High 0 ns tRW WRN, RDN pulse width 225 ns tDD Data valid after RDN Low 175 ns tDA RDN Low to data bus active7 15 ns tDF Data bus floating after RDN High 125 ns tDI RDN High to data bus invalid7 20 ns tDS Data setup time before WRN High 100 ns tDH Data hold time after WRN High 20 ns tRWD High time between reads and/or writes5, 6 200 ns |
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