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B37941X1103K060 Datasheet(PDF) 8 Page - EPCOS |
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B37941X1103K060 Datasheet(HTML) 8 Page - EPCOS |
8 / 14 page Multilayer ceramic capacitor B37941X MLSC series MLSC 0805, 50 V and 100 V Specification and stress test methods No. Stress test Specification and acceptance criteria Test description in accordance to AEC-Q200 X7R 1 Pre- and post-stress electrical test Initial values in accordance to chapter “Electrical data” Initial and final measurements 24 ±2 h after test and / or heat treatment (only X7R dielectrics) @ room temperature 3 High temperature exposure ∆C/C within ±4.5% ∆C/C within ±7.5% for 25 V D.F. < 25 · 10 -3 D.F. < 50 · 10 -3 for 25 V I.R. > 1 · 10 5 MΩ or τ > 1000 s resp. 500 s for 25 V (whichever is less) Capacitor fixed on PCB, apply 150 °C for 1000 ±12 h, measurements 24 ±2 h after tests @ room temperature 4 Temperature cycling ∆C/C within ±4.5% ∆C/C within ±7.5% for 25 V D.F. < 25 · 10 -3 D.F. < 50 · 10 -3 for 25 V I.R. > 1 · 10 5 MΩ or τ > 1000 s resp. 500 s for 25 V (whichever is less) Capacitor fixed on PCB, apply 1000 cycles between -55 °C/150 °C, transfer time < 10 s, dwell time > 15 min, measurements 24 ±2 h after heat treatment (150 °C, 1 h) @ room temperature 5 Destructive physical analysis No defects or abnormalities Per EIA-469 6 Moisture resistance ∆C/C within ±10% ∆C/C within ±12.5% for 25 V D.F. < 25 · 10 -3 D.F. < 75 · 10 -3 for 25 V I.R. > 1 · 10 3 MΩ or τ > 50 s resp. 25 s for 25 V (whichever is less) Apply the cycle given in MIL-STD-202 Method 106 (25 to 65 °C, 80 to 100% RH) 10 times, measurements 24 ±2 h after tests @ room temperature 7 Biased humidity ∆C/C within ±10% ∆C/C within ±12.5% for 25 V D.F. < 25 · 10 -3 D.F. < 75 · 10 -3 for 25 V I.R. > 1 · 10 3 MΩ or τ > 50 s resp. 25 s for 25 V (whichever is less) Apply 85 °C/85% RH and rated voltage for 1000 ±12 h, surge current < 50 mA, measurements 24 ±2 h after heat treatment (150 °C, 1 h) @ room temperature KB VS PE July 2005 Please read Cautions and warnings and Page 8 of 14 Important notes at the end of this document. |
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