© 2006 Fairchild Semiconductor Corporation

www.fairchildsemi.com

FAN7529 Rev. 1.0.2

4

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-

ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-

tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The

Note:

1. Regarding the test environment and PCB type, please refer to JESD51-2 and JESD51-10.

Symbol

Parameter

Value

Unit

Supply Voltage

V

Peak Drive Output Current

+500/-800

mA

±10

mA

Detector Clamping Diodes

±10

mA

Error Amplifier, MOT, CS Input Voltages

-0.3 to 6

V

Operating Junction Temperature

150

°C

Operating Temperature Range

-40 to 125

°C

Storage Temperature Range

-65 to 150

°C

ESD Capability, Human Body Model

2.0

kV

ESD Capability, Machine Model

300

V

ESD Capability, Charged Device Model

500

V

Symbol

Parameter

Value

Unit

θ

J

Α

Thermal Resistance, Junction-to-Ambient

8-DIP

110

°C/W

8-SOP

150

°C/W