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CS5535-UDC Datasheet(PDF) 48 Page - National Semiconductor (TI) |
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CS5535-UDC Datasheet(HTML) 48 Page - National Semiconductor (TI) |
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48 / 555 page  www.national.com 48 Revision 0.8 Signal Definitions (Continued) TMS N3 I JTAG Test Mode Select. TDI P1 I JTAG Test Data In. TDO P2 O, TS JTAG Test Data Out. From reset, this output is TRI-STATE. It is only enabled and driven when commanded to output or pass-through data per JTAG standards. T_DEBUG_IN M2 I Test Debug Input. Input to GeodeLink Control Processor (GLCP) from GX2. T_DEBUG_OUT M3 O Test Debug Out. Output from GeodeLink Control Processor (GLCP) to GX2. LVD_TEST B9 O Low Voltage Detect Test. Manufacturing test only. No operational use. Make no connection. TEST_MODE A6 I Test Mode. Manufacturing test only. No operational use. Tie low. FUNC_TEST F3 I Functional Test. Manufacturing test only. No operational use. Tie low. 2.2.9 Debug and Manufacturing Test Interface (Continued) Signal Name Ball No. Type Description |
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