Philips Semiconductors

Product data

74F07

Hex inverter/buffer drivers (open-collector)

2004 Mar 12

5

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

MIN

TYP2

MAX

IOH

High-level output current

VCC = MIN, VIL = MAX,

VOH = MAX, VIH = MIN

250

µA

VOL

Low-level output voltage

VCC = MIN,

VIL = MAX,

IOL = MAX

±10% VCC

0.30

0.50

V

VIH = MIN

±5% VCC

0.30

0.50

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

V

II

Input current at maximum input

voltage

VCC = MAX, VI = 7.0V

100

µA

IIH

High-level input current

VCC = MAX, VI = 2.7V

20

µA

IIL

Low-level input current

VCC = MAX, VI = 0.5V

–0.6

mA

ICC

Supply current (total)

ICCH

VCC = MAX

10

14

mA

ICCL

32

45

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

AC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITION

VCC = +5.0V

Tamb = +25°C

CL = 50pF, RL = 100Ω

VCC = +5.0V ± 10%

Tamb = 0°C to +70°C

CL = 50pF, RL = 100Ω

UNIT

Min

Typ

Max

Min

Max

tPLH

tPHL

Propagation delay

An to Yn

Waveform 1

2.0

3.0

4.0

5.0

6.0

7.0

2.0

2.5

6.5

7.5

ns