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NL27WZ16DFT2G Datasheet(PDF) 3 Page - ON Semiconductor

Part # NL27WZ16DFT2G
Description  Dual Buffer
Download  14 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NL27WZ16DFT2G Datasheet(HTML) 3 Page - ON Semiconductor

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NL27WZ16
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MAXIMUM RATINGS
Symbol
Characteristics
Value
Units
VCC
DC Supply Voltage
TSOP−6, SC−88 (NLV)
SC−88, SC−74, UDFN6
−0.5 to +7.0
−0.5 to +6.5
V
VIN
DC Input Voltage
TSOP−6, SC−88 (NLV)
SC−88, SC−74, UDFN6
−0.5 to +7.0
−0.5 to +6.5
V
VOUT
DC Output Voltage
Active−Mode (High or Low State)
TSOP−6, SC−88 (NLV)
Tri−State Mode (Note 1)
Power−Down Mode (VCC = 0 V)
−0.5 to VCC +0.5
−0.5 to +7.0
−0.5 to +7.0
V
DC Output Voltage
Active−Mode (High or Low State)
SC−88, SC−74, UDFN6
Tri−State Mode (Note 1)
Power−Down Mode (VCC = 0 V)
−0.5 to VCC +0.5
−0.5 to +6.5
−0.5 to +6.5
V
IIK
DC Input Diode Current, VIN < GND
−50
mA
IOK
DC Output Diode Current, VOUT < GND
−50
mA
IOUT
DC Output Source/Sink Current
±50
mA
ICC or IGND DC Supply Current per Supply Pin or Ground Pin
±100
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case for 10 secs
260
°C
TJ
Junction Temperature under Bias
+150
°C
qJA
Thermal Resistance (Note 2)
SC−88
SC−74
UDFN6
377
320
154
°C/W
PD
Power Dissipation in Still Air
SC−88
SC−74
UDFN6
332
390
812
mW
MSL
Moisture Sensitivity
Level 1
FR
Flamebility Rating
Oxygen Index: 28 to 34 UL 94−V−0 @ 0.125 in
VESD
ESD Withstand Voltage (Note 3)
Human Body Model
Charged Device Model
(NLV) Charged Device Model
2000
1000
N/A
V
ILATCHUP
Latchup Performance (Note 4)
(NLV)
±100
±500
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Applicable to devices with outputs that may be tri−stated.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow per JESD51−7.
3. HBM tested to ANSI/ESDA/JEDEC JS−001−2017. CDM tested to EIA/JESD22−C101−F. JEDEC recommends that ESD qualification to
EIA/JESD22−A115−A (Machine Model) be discontinued per JEDEC/JEP172A.
4. Tested to EIA/JESD78 Class II.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
Positive DC Supply Voltage
1.65
5.5
V
VIN
DC Input Voltage
0
5.5
V
VOUT
DC Output Voltage
Active−Mode (High or Low State)
Tri−State Mode (Note 1)
Power−Down Mode (VCC = 0 V)
0
0
0
VCC
5.5
5.5
V
TA
Operating Temperature Range
−55
+125
°C
tr , tf
Input Transition Rise or Fall Rate
VCC = 1.65 V to 1.95 V
VCC = 2.3 V to 2.7 V
VCC = 3.0 V to 3.6 V
VCC = 4.5 V to 5.5 V
0
0
0
20
20
10
5
ns
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.


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