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EN29LV010 Datasheet(PDF) 7 Page - Eon Silicon Solution Inc. |
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EN29LV010 Datasheet(HTML) 7 Page - Eon Silicon Solution Inc. |
7 / 35 page This Data Sheet may be revised by subsequent versions ©2003 Eon Silicon Solution, Inc., www.essi.com.tw or modifications due to changes in technical specifications. 7 EN29LV010 Rev. B, Issue Date: 2004/01/05 whichever happens later. All data is latched on the rising edge of WE# or CE#, whichever happens first. The system is not required to provide further controls or timings. The device automatically provides internally generated program / erase pulses and verifies the programmed /erased cells’ margin. The host system can detect completion of a program or erase operation by reading the DQ[7] (Data# Polling) and DQ[6] (Toggle) status bits. The ‘Command Definitions’ section of this document provides details on the specific device commands implemented in the EN29LV010. Sector Protection/Unprotection The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously protected sectors. Sector protection/unprotection is intended only for programming equipment. This method requires VID be applied to both OE# and A9 pin and non-standard microprocessor timings are used. This method is described in a separate document called EN29LV010 Supplement, which can be obtained by contacting a representative of Eon Silicon Solution, Inc. Automatic Sleep Mode The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tacc + 30ns. The automatic sleep mode is independent of the CE#, WE# and OE# control signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output is latched and always available to the system. ICC4 in the DC Characteristics table represents the automatic sleep more current specification. |
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