Si534

4

Preliminary Rev. 0.4

Table 6. CLK± Output Phase Noise (Typical)

Configuration

Output

81.25 MHz

LVDS

312.5 MHz

LVPECL

1066 MHz

LVPECL

Units

Offest Frequency (f)

100 Hz

1kHz

10 kHz

100 kHz

1MHz

10 MHz

100 MHz

L (f)

dBc/Hz

–110

–127

–134

–136

–143

–147

n/a

–100

–115

–119

–123

–135

–144

–147

–87

–102

–107

–111

–121

–135

–142

Parameter

Symbol

Rating

Units

Supply Voltage

–0.5 to +3.8

Volts

Input Voltage (any input pin)

Volts

Storage Temperature

–55 to +125

ºC

ESD Sensitivity (HBM, per JESD22-A114)

ESD

>2500

Volts

260

ºC

10

seconds

Notes:

1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional

operation or specification compliance is not implied at these conditions.

soldering profiles.

Table 8. Environmental Compliance

The Si534 meets the following qualification test requirements.

Parameter

Conditions/ Test Method

Mechanical Shock

MIL-STD-883F, Method 2002.3 B

Mechanical Vibration

MIL-STD-883F, Method 2007.3 A

Solderability

MIL-STD-883F, Method 203.8

Gross & Fine Leak

MIL-STD-883F, Method 1014.7

Resistance to Solvents

MIL-STD-883F, Method 2016