6 Specifications

6.1 Absolute Maximum Ratings, TL331-Q1

over operating free-air temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

Supply voltage(2)

0

36

V

Differential input voltage(3)

–36

36

V

Input voltage range (either input)

–0.3

36

V

Output voltage

0

36

V

Output current

0

20

mA

Duration of output short-circuit to ground(4)

Unlimited

Operating virtual junction temperature

150

°C

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under

Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device

reliability.

(2)

All voltage values, except differential voltages, are with respect to the network ground.

(3)

Differential voltages are at IN+ with respect to IN–.

(4)

6.2 Absolute Maximum Ratings, TL331B-Q1 and TL391B-Q1

over operating free-air temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

Supply voltage(2)

-0.3

38

V

Differential input voltage(3)

–38

38

V

Input voltage range (either input)

–0.3

38

V

Output voltage

-0.3

38

V

Output current

20

mA

Duration of output short-circuit to ground(4)

Unlimited

Input current(5)

–50

mA

Operating virtual junction temperature

–40

150

°C

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under

Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device

reliability.

(2)

All voltage values, except differential voltages, are with respect to the network ground.

(3)

Differential voltages are at IN+ with respect to IN–.

(4)

(5)

Input current flows thorough parasitic diode to ground and will turn on parasitic transistors that will increase ICC and may cause output

to be incorrect. Normal operation resumes when input current is removed.

6.3 ESD Ratings, All Devices

VALUE

UNIT

Electrostatic discharge

Human-body model (HBM), per AEC Q100-002(1)

±2000

V

Charged-device model (CDM), per AEC Q100-0111

±750

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

TL331-Q1, TL331B-Q1, TL391B-Q1

SLVS969F – OCTOBER 2009 – REVISED JANUARY 2021

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