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CLRC66103HNT Datasheet(PDF) 29 Page - NXP Semiconductors |
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CLRC66103HNT Datasheet(HTML) 29 Page - NXP Semiconductors |
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29 / 152 page  NXP Semiconductors CLRC661 High performance NFC frontend CLRC661 plus 8.4.6.4 Test Data Input (TDI) The TDI pin provides a stream of serial information to the IR chain and the DR chains. TDI is sampled on the rising edge of TCK and, depending on the current TAP state and the current instruction, presents this data to the proper shift register chain. Because the TDI pin is sampled on the rising edge of TCK, the IEEE Standard 1149.1 expects the value on TDI to change on the falling edge of TCK. The internal pull-up resistor on the TDI pin is enabled. 8.4.6.5 Test Data Output (TDO) The TDO pin provides an output stream of serial information from the IR chain or the DR chains. The value of TDO depends on the current TAP state, the current instruction, and the data in the chain being accessed. In order to save power when the port is not being used, the TDO pin is placed in an inactive drive state when not actively shifting out data. Because TDO can be connected to the TDI of another controller in a daisy-chain configuration, the IEEE Standard 1149.1 expects the value on TDO to change on the falling edge of TCK. 8.4.6.6 Data register According to the IEEE1149.1 standard, there are two types of data register defined: bypass and boundary scan The bypass register enable the possibility to bypass a device when part of the scan path. Serial data is allowed to be transferred through a device from the TDI pin to the TDO pin without affecting the operation of the device. The boundary scan register is the scan-chain of the boundary cells. The size of this register is dependent on the command. 8.4.6.7 Boundary scan cell The boundary scan cell opens the possibility to control a hardware pin independent of its normal use case. Basically the cell can only do one of the following: control, output and input. 001aam306 TAP TAP IC1 IC2 TCK TMS TCK TMS TDO TDO Boundary scan cell TDI TDI Figure 20. Boundary scan cell path structure 8.4.6.8 Boundary scan path This chapter shows the boundary scan path of the CLRC661. CLRC661 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Product data sheet Rev. 3.7 — 23 June 2021 COMPANY PUBLIC 456937 29 / 152 |
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