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APT30DQ120BCT Datasheet(PDF) 4 Page - Thinki Semiconductor Co., Ltd. |
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APT30DQ120BCT Datasheet(HTML) 4 Page - Thinki Semiconductor Co., Ltd. |
4 / 5 page © 1995 Thinki Semiconductor Co., Ltd. http://www.thinkisemi.com.tw/ Page 4/5 Rev.11T APT30DQ120BCT/APT30DQ120BCTG 4 3 1 2 5 5 Zer o 1 2 3 4 di F /dt - Rate of Diode Current Change Through Zero Crossing. I F - Forward Conduction Current I RRM - Maximum Reverse Recovery Current . trr - Reverse R ecovery Time, measured from zero crossing wher e diode Qrr - Area Under the Curve Defined by I RRM and t rr. current goes from positive to negative, to the point at which the straight line through I RRM and 0.25 I RRM passes through zero . 0.25 IRR M PEARSON 2878 CURRENT TRANSFORMER di F /dt Adjus t 30μH D.U.T. +18V 0V V r trr/Qrr Waveform Fig. 9. Diode Test Circuit Fig. 10. Diode Reverse Recovery Waveform and Definition |
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