DDR SDRAM

DDR SDRAM 1Gb M-die (x4, x8) Pb-Free

Revision 1.1 October, 2004

64M x 4Bit x 4 Banks / 32M x 8Bit x 4 Banks Double Data Rate SDRAM

The K4H1G0438M / K4H1G0838M is 1,073,741,824 bits of double data rate synchronous DRAM organized as 4x 67,108,864/ 4x

33,554,432 words by 4/ 8bits, fabricated with SAMSUNG

′s high performance CMOS technology. Synchronous features with Data Strobe

allow extremely high performance up to 333Mb/s per pin. I/O transactions are possible on both edges of DQS. Range of operating fre-

quencies, programmable burst length and programmable latencies allow the device to be useful for a variety of high performance mem-

ory system applications.

General Description

Absolute Maximum Rating

Parameter

Symbol

Value

Unit

-0.5 ~ 3.6

V

-1.0 ~ 3.6

V

Storage temperature

-55 ~ +150

°C

Power dissipation

1.5

W

Short circuit current

50

mA

Note : Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.

Functional operation should be restricted to recommend operation condition.

Exposure to higher than recommended voltage for extended periods of time could affect device reliability.

DC Operating Conditions

°C)

Parameter

Symbol

Min

Max

Unit

Note

2.3

2.7

I/O Supply voltage

2.3

2.7

V

I/O Reference voltage

0.49*VDDQ

0.51*VDDQ

V

1

I/O Termination voltage(system)

V2

Input logic high voltage

V

Input logic low voltage

-0.3

V

Input Voltage Level, CK and CK inputs

-0.3

V

Input Differential Voltage, CK and CK inputs

0.36

V

3

V-I Matching: Pullup to Pulldown Current Ratio

VI(Ratio)

0.71

1.4

-

4

Input leakage current

-2

2

uA

Output leakage current

-5

5

uA

-16.8

mA

16.8

mA

-9

mA

9mA

1.VREF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the dc level of same.

Peak-to peak noise on VREF may not exceed +/-2% of the dc value.

4. The ratio of the pullup current to the pulldown current is specified for the same temperature and voltage, over the entire

temperature and voltage range, for device drain to source voltages from 0.25V to 1.0V. For a given output, it represents the

maximum difference between pullup and pulldown drivers due to process variation. The full variation in the ratio of the

maximum to minimum pullup and pulldown current will not exceed 1/7 for device drain to source voltages from 0.1 to 1.0.

Note :