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TM124FBK32 Datasheet(PDF) 7 Page - Texas Instruments |
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TM124FBK32 Datasheet(HTML) 7 Page - Texas Instruments |
7 / 11 page TM124FBK32, TM124FBK32S 1048576 BY 32-BIT TM248GBK32, TM248GBK32S 2097152 BY 32-BIT DYNAMIC RAM MODULES SMMS664A – DECEMBER 1995 – REVISED JUNE 1996 7 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 electrical characteristics over full ranges of recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS ’248GBK32-60 ’248GBK32-70 ’248GBK32-80 UNIT PARAMETER TEST CONDITIONS MIN MAX MIN MAX MIN MAX UNIT VOH High-level output voltage IOH = – 5 mA 2.4 2.4 2.4 V VOL Low-level output voltage IOL = 4.2 mA 0.4 0.4 0.4 V II Input current (leakage) VI = 0 to 6.5 V, VCC = 5 V, All other pins = 0 to VCC ±20 ±20 ±20 µA IO Output current (leakage) VO = 0 to VCC,VCC = 5.5 V, CAS high ±20 ±20 ±20 µA ICC1 Read- or write-cycle current (see Note 3) Minimum cycle, VCC = 5.5 V 856 736 656 mA ICC1 Standby current After one memory cycle, RAS and CAS high, VIH = 2.4 V (TTL) 32 32 32 mA ICC1 Standby current After one memory cycle, RAS and CAS high, VIH = VCC – 0.2 V (CMOS) 16 16 16 mA ICC3 Average refresh current (RAS-only or CBR) (see Note 3) Minimum cycle, VCC = 5.5 V, RAS cycling, CAS high (RAS-only), RAS low after CAS low (CBR) 1680 1440 1280 mA ICC4 Average EDO current (see Note 4) tPC = minimum, VCC = 5.5 V, RAS low, CAS cycling 736 656 576 mA NOTES: 3. Measured with a maximum of one address change while RAS = VIL. 4. Measured with a maximum of one address change while CAS = VIH. capacitance over recommended ranges of supply voltage and operating free-air temperature f = 1 MHz (see Note 5) ’124FBK32 ’248GBK32 UNIT MIN MAX MIN MAX UNIT Ci(A) Input capacitance, address inputs 40 80 pF Ci(R) Input capacitance, RAS 28 28 pF Ci(C) Input capacitance, CAS 14 28 pF Ci(W) Input capacitance, write-enable input 56 112 pF Co(DQ) Output capacitance on DQ pins 7 14 pF NOTE 5: VCC equal to 5 V ± 0.5 V and the bias on pins under test is 0 V. |
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