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AM29LV800DB-120ED Datasheet(PDF) 32 Page - Advanced Micro Devices |
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AM29LV800DB-120ED Datasheet(HTML) 32 Page - Advanced Micro Devices |
32 / 51 page 30 Am29LV800D Am29LV800D_00_A4_E January 21, 2005 PR EL IM IN A R Y Test Conditions Table 7. Test Specifications Key to Switching Waveforms 2.7 kΩ CL 6.2 kΩ 3.3 Device Under Test Figure 1. Test Setup Note: Diodes are IN3064 or Test Condition -70 -90, -120 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 3.0 V 0.0 V 1.5 V 1.5 V Output Measurement Level Input Figure 1. Input Waveforms and Measurement Levels |
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