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SCC2681T Datasheet(PDF) 7 Page - NXP Semiconductors |
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SCC2681T Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 15 page ![]() Philips Semiconductors Product data SCC2681T Dual asynchronous receiver/transmitter (DUART) 2004 Apr 06 7 DC ELECTRICAL CHARACTERISTICS1, 2, 3 Tamb = 0 °C to +70 °C; VCC = +5.0 V ± 10% SYMBOL PARAMETER TEST CONDITIONS LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS Min Typ Max UNIT VIL LOW-level input voltage – – 0.8 V VIH HIGH-level input voltage (except X1/CLK) Tamb ≥ 0 °C 2.0 – – V VIH HIGH-level input voltage (except X1/CLK) Tamb < 0 °C 2.5 – – V VIH HIGH-level input voltage (X1/CLK) 0.8 VCC – – V VOL LOW-level output voltage IOL = 2.4 mA – – 0.4 V VOH HIGH-level output voltage (except open-drain outputs)4 IOH = –400 µA VCC – 0.5 – – V IIX1 X1/CLK input current VIN = 0 V to VCC –10 – +10 µA IILX1 X1/CLK input LOW current – operating VIN = 0 V –75 – 0 µA IIHX1 X1/CLK input HIGH current – operating VIN = VCC 0 – 75 µA IOHX2 X2 output HIGH current – operating VOUT = VCC; X1 = 0 0 – +75 µA IOHX2S X2 output HIGH short circuit current – operating VOUT = 0 V; X1 = 0 –10 – –1 mA IOLX2 X2 output LOW current – operating VOUT = 0 V; X1 = VCC –75 – 0 µA IOLX2S X2 output LOW short circuit current – operating VOUT = VCC; X1 = VCC 1 – 10 mA Input leakage current: II All except input port pins VIN = 0 V to VCC –10 – +10 µA Input port pins VIN = 0 V to VCC –20 – +10 µA IOZH Output off current HIGH, 3-state data bus VIN = VCC – – 10 µA IOZL Output off current LOW, 3-state data bus VIN = 0 V –10 – – µA IODL Open-drain output LOW current in off-state VIN = 0 V –10 – – µA IODH Open-drain output HIGH current in off-state VIN = VCC – – 10 µA ICC Power supply current5 ICC Operating mode CMOS input levels – – 10 mA NOTES: 1. Parameters are valid over specified temperature range. 2. All voltage measurements are referenced to ground (GND). For testing, all inputs swing between 0.4 V and 2.4 V with a transition time of 5 ns maximum. For X1/CLK this swing is between 0.4 V and 4.4 V. All time measurements are referenced at input voltages of 0.8 V and 2.0 V and output voltages of 0.8 V and 2.0 V, as appropriate. 3. Typical values are at +25 °C, typical supply voltages, and typical processing parameters. 4. Test conditions for outputs: CL = 150 pF, except interrupt outputs. Test conditions for interrupt outputs: CL = 50 pF, RL = 2.7 kΩ to VCC. 5. All outputs are disconnected. Inputs are switching between CMOS levels of VCC – 0.2 V and VSS + 0.2 V. |
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