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LM2575T-12 Datasheet(PDF) 2 Page - ON Semiconductor |
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LM2575T-12 Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 26 page LM2575 http://onsemi.com 2 Figure 1. Block Diagram and Typical Application 7.0 V − 40 V Unregulated DC Input L1 330 mH GND +Vin 1 Cin 100 mF 3ON/OFF 5 Output 2 Feedback 4 D1 1N5819 Cout 330 mF Typical Application (Fixed Output Voltage Versions) Representative Block Diagram and Typical Application Unregulated DC Input +Vin 1 Cout Feedback 4 Cin L1 D1 R2 R1 1.0 k Output 2 GND 3 ON/OFF 5 Reset Latch Thermal Shutdown 52 kHz Oscillator 1.235 V Band−Gap Reference Freq Shift 18 kHz Comparator Fixed Gain Error Amplifier Current Limit Driver 1.0 Amp Switch ON/OFF 3.1 V Internal Regulator Regulated Output Vout Load Output Voltage Versions 3.3 V 5.0 V 12 V 15 V R2 ( W) 1.7 k 3.1 k 8.84 k 11.3 k For adjustable version R1 = open, R2 = 0 W LM2575 5.0 V Regulated Output 1.0 A Load This device contains 162 active transistors. ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.) Rating Symbol Value Unit Maximum Supply Voltage Vin 45 V ON/OFF Pin Input Voltage − −0.3 V ≤ V ≤ +Vin V Output Voltage to Ground (Steady−State) − −1.0 V Power Dissipation Case 314B and 314D (TO−220, 5−Lead) PD Internally Limited W Thermal Resistance, Junction−to−Ambient RqJA 65 °C/W Thermal Resistance, Junction−to−Case RqJC 5.0 °C/W Case 936A (D2PAK) PD Internally Limited W Thermal Resistance, Junction−to−Ambient (Figure 34) RqJA 70 °C/W Thermal Resistance, Junction−to−Case RqJC 5.0 °C/W Storage Temperature Range Tstg −65 to +150 °C Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 k W) − 3.0 kV Lead Temperature (Soldering, 10 s) − 260 °C Maximum Junction Temperature TJ 150 °C Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. |
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