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S29AL008D Datasheet(PDF) 36 Page - SPANSION |
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S29AL008D Datasheet(HTML) 36 Page - SPANSION |
36 / 55 page ![]() 36 S29AL008D S29AL008D_00A3 June 16, 2005 Da t a S h ee t Test Conditions Note: Nodes are IN3064 or equivalent. Figure 11. Test Setup Table 7. Test Specifications Test Condition 55 70 90 Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–3.0 V Input timing measurement reference levels 1.5 Output timing measurement reference levels 1.5 2.7 kΩ CL 6.2 kΩ 3.3 V Device Under Test |
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