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70V657S12DRGI8 Datasheet(PDF) 10 Page - Integrated Device Technology |
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70V657S12DRGI8 Datasheet(HTML) 10 Page - Integrated Device Technology |
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10 / 24 page  IDT70V659/58/57S High-Speed 3.3V 128/64/32K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges 10 AC Test Conditions (VDDQ - 3.3V/2.5V) Figure 1. AC Output Test load. Figure 2. Output Test Load (For tCKLZ, tCKHZ, tOLZ, and tOHZ). *Including scope and jig. Figure 3. Typical Output Derating (Lumped Capacitive Load). Input Pulse Levels Input Rise/Fall Times Input Timing Reference Levels Output Reference Levels Output Load GND to 3.0V / GND to 2.5V 2ns Max. 1.5V/1.25V 1.5V/1.25V Figures 1 and 2 4869 tbl 11 1.5V/1.25 50 Ω 50 Ω 4869 drw 03 10pF (Tester) DATAOUT , 4869 drw 04 590 Ω 5pF* 435 Ω 3.3V DATAOUT , 833 Ω 5pF* 770 Ω 2.5V DATAOUT , -1 1 2 3 4 5 6 7 20.5 30 50 80 100 200 10.5pF is the I/O capacitance of this device, and 10pF is the AC Test Load Capacitance. Capacitance (pF) ∆tAA (Typical, ns) 4869 drw 05 , |
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